Name: 03/108069 DC : DRAFT MAY 2003
Brand: BSI

IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD

Superseded date

02-14-2006

Published date

11-23-2012

Publisher

British Standards Institution

Committee	EPL/49
DocumentType	Draft
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 62276:2016

IEC 61019-1-2:1993	Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
IEC 60862-1:2015	Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60758:2016	Synthetic quartz crystal - Specifications and guidelines for use
IEC 61019-2:2005	Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60862-2:2012	Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60862-3:2003	Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
IEC 61019-3:1991	Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
IEC 61019-1-1:1990	Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values

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