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10/30211446 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS EN 62047-11 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 11: TEST METHOD FOR LINEAR THERMAL EXPANSION COEFFICIENTS OF MEMS MATERIALS

Available format(s)

Hardcopy , PDF

Superseded date

10-31-2013

Language(s)

English

FOREWORD
1 Scope
2 Normative References
3 Symbols and designations
4 Test piece
5 Testing method and test apparatus
6 Test report
Annex A (Informative) - Test piece fabrication
Annex B (Informative) - Test piece handling example
Annex C (Informative) - Test apparatus and test piece
        releasing process
Annex D (Informative) - Data analysis example

BS EN 62047-11

Committee
EPL/47
DocumentType
Draft
Pages
14
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 62047-1:2016 Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
IEC 62047-3:2006 Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

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US$23.96
Excluding Tax where applicable

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