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12/30245653 DC : 0

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS ISO 15932 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY
Available format(s)

Hardcopy , PDF

Superseded date

12-31-2013

Language(s)

English

Foreword
Introduction
1 Scope
2 Normative references
3 Abbreviations
4 Definitions of terms used in the physical basis
   of AEM
5 Definitions of terms used in AEM instrumentation
6 Definitions of terms used in specimen preparation
   of AEM
7 Definitions of terms used in AEM image formation
   and processing
8 Definitions of terms used in AEM image interpretation
   and analysis
9 Definitions of terms used in the measurement and
   calibration of AEM image magnification and
   resolution
10 Definitions of terms used in electron diffraction in
   AEM
Bibliography
Alphabetical index

BS ISO 15932

Committee
CII/9
DocumentType
Draft
Pages
31
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

ISO 10241:1992 International terminology standards Preparation and layout
ISO 1087-1:2000 Terminology work Vocabulary Part 1: Theory and application
ISO 22493:2014 Microbeam analysis Scanning electron microscopy Vocabulary
ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 704:2009 Terminology work — Principles and methods

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