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Superseded

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BS EN 62435-1 - ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 1: GENERAL

Available format(s)

Hardcopy , PDF

Superseded date

08-31-2017

Language(s)

English

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Terms and definitions
4 Purpose of Long-term storage
5 Logistics
6 Storage Considerations for Devices after Card (or
   Other) Attachment
7 Handling
8 Inspection
9 Inventory Control Process
10 Transportation
11 Lead Finishes
12 Kitting and Delivery Requirements
13 Validation
14 Unplanned Storage & types of storage
15 In addition to the components, what else should be
   stored?
16 Storage Facility
17 Policies
18 Legislation & Environmental Issues
Annex A (informative) - Example of a component list
Annex B (informative) - Examples of periodic and/or
        de-stocking tests
Annex C (informative) - Parameters influencing the
        quantity of components to be stored

BS EN 62435-1.

Committee	EPL/47
DocumentType	Draft
Pages	27
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 62435-1:2017

IEC 60068-2-20:2008	Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 61340-5-1:2016	Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC TR 61340-5-2:2007	Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
IEC TR 62380:2004	Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
IEC TS 61945:2000	Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
IEC 60068-2-17:1994	Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
EN 190000:1995	Generic Specification: Monolithic integrated circuits