BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES

Available format(s)

Hardcopy , PDF

Language(s)

English

Publisher

British Standards Institution

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Technical requirements
Annex A (informative) - Flowchart of IEC 62668-1 requirements
Annex B (informative) - Example of detailed tests list, linked
        with risks levels
Annex C (informative) - iNEMI assessment methodology and
        metric development
Annex D (informative) - Summary of SAE AS6171 series
        proposed test methods under consideration by
        SAE International Techniques for Suspect/Counterfeit
        EEE Assembly Detection by Various Test Methods
Bibliography

BS EN 62668-2.

Committee	GEL/107
DocumentType	Draft
Pages	55
PublisherName	British Standards Institution
Status	NA

SAE AS 5553B : 2016	COUNTERFEIT ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION
ISO 16678:2014	Guidelines for interoperable object identification and related authentication systems to deter counterfeiting and illicit trade
SAE AS 6174 : 2014	COUNTERFEIT MATERIEL - ASSURING ACQUISITION OF AUTHENTIC AND CONFORMING MATERIEL
SAE AS 6171/1 : 2016	SUSPECT/COUNTERFEIT TEST EVALUATION METHOD
SAE AS 6171 : 2016	TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
SAE AS 6171/6 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ACOUSTIC MICROSCOPY (AM) TEST METHODS
MIL-PRF-55681 Revision G:2016	CAPACITOR, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
SAE AS 6081 : 2012	FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS: AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION - DISTRIBUTORS
SAE AS 6171/11 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS
SAE AS 6171/7 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ELECTRICAL TEST METHODS
MIL-PRF-19500 Revision P:2010	SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
IEC/ISO 31010:2009	Risk management - Risk assessment techniques
ISO 31000:2009	Risk management Principles and guidelines
IEC TS 62668-1:2016	Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components
SEMI T20.2 : 2009(R2016)	GUIDE FOR QUALIFICATIONS OF AUTHENTICATION SERVICE BODIES FOR DETECTING AND PREVENTING COUNTERFEITING OF SEMICONDUCTORS AND RELATED PRODUCTS
MIL-STD-750 Revision F:2011	TEST METHODS FOR SEMICONDUCTOR DEVICES
MIL-STD-202-107 Base Document:2015	METHOD 107, THERMAL SHOCK
MIL-STD-202-106 Base Document:2015	METHOD 106, MOISTURE RESISTANCE
MIL-PRF-39014 Revision J:2016	Capacitor, Fixed, Ceramic Dielectric (General Purpose), Established Reliability and Non-Established Reliability, General Specification for
IEC TS 62239-1:2015	Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
SAE AS 6171/8 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RAMAN SPECTROSCOPY TEST METHODS
SAE AS 6171/3 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY X-RAY FLUORESCENCE TEST METHODS
SAE AS 6171/4 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS
IEC 62402:2007	Obsolescence management - Application guide
GEIA STD 0016 : 2012	PREPARING A DMSMS MANAGEMENT PLAN
ISO 14001:2015	Environmental management systems — Requirements with guidance for use
IEC TS 62686-1:2015	Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
SAE ARP 6178 : 2011	FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS - TOOL FOR RISK ASSESSMENT OF DISTRIBUTORS
SAE AS 6171/9 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY FOURIER TRANSFORM INFRARED SPECTROSCOPY (FTIR) TEST METHODS
MIL-PRF-39003 Revision N:2016	Capacitor, Fixed, Electrolytic (Solid Electrolyte), Tantalum, Established Reliability, General Specification for
ISO 9001:2015	Quality management systems — Requirements
MIL-STD-202-108 Base Document:2015	METHOD 108, LIFE (AT ELEVATED AMBIENT TEMPERATURE)
SAE AS 6171/5 : 2016	TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS
MIL-STD-1580 Revision B:2003	DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
ISO 28000:2007	Specification for security management systems for the supply chain
IEC 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60115-8:2009	Fixed resistors for use in electronic equipment - Part 8: Sectional specification - Fixed surface mount resistors
SEMI T20 : 2010(R2016)	SPECIFICATION FOR AUTHENTICATION OF SEMICONDUCTORS AND RELATED PRODUCTS
ISO Guide 73:2009	Risk management — Vocabulary
IEC 60068-2-30:2005	Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)