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ASTM F 458 : 2013 : R2018

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Current

The latest, up-to-date edition.

Standard Practice for Nondestructive Pull Testing of Wire Bonds (Withdrawn 2023)
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

04-10-2018

CONTAINED IN VOL. 10.04, 2018 Defines nondestructive testing of individual wire bonds made by either ultrasonic, thermal compression or thermosonic techniques.

1.1This practice covers nondestructive testing of individual wire bonds made by either ultrasonic, thermal compression or thermosonic techniques. The test is intended to reveal (by breaking) nonacceptable wire bonds but is designed to avoid damage to acceptable wire bonds.

Note 1:Common usage at the present time considers the term “wire bond” to include the entire interconnection: both welds and the intervening wire span.

1.2The practice covers wire bonds made with small-diameter (from 0.0007 to 0.003-in. (18 to 76-μm)) wire such as the type used in integrated circuits and hybrid microcircuits, system in package, and so forth.

1.3This practice can be used only when the loop height of the wire bond is large enough to allow a suitable hook for pulling to be placed under the wire.

1.4While the procedure is applicable to wire of any composition and metallurgical state, criteria are given only for gold and aluminum wire.

1.5A destructive pull test is used on wire bonds of the same type and geometry to provide the basis for the determination of the nondestructive pulling force to be used in this practice. This may only be used if the sample standard deviation, s, of the pulling forces required to destroy at least 25 of the same wire bonds tested by the destructive pull-test method is less than or equal to 0.25 of the sample average, x. If s > 0.25 x, this practice may not be used.

Note 2:If s > 0.25 x, some aspect of the bonding process is out of control. Following corrective action, the destructive pull-test measurements should be repeated to determine if the s 0.25 x criterion is met.

1.6The nondestructive wire-bond pull test is to be performed before any other treatment or screening following bonding and at the same point in processing as the accompanying destructive test. Preferably, this is done immediately after bonding.

1.7The procedure does not ensure against wire-bond failure modes induced after the test has been performed.

1.8The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.

1.9This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.10This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Committee
F 01
DocumentType
Standard Practice
Pages
3
ProductNote
Reconfirmed 2018
PublisherName
American Society for Testing and Materials
Status
Current
Supersedes

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS

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