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ASTM F 97 : 1972 : R2002 : EDT 1

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration (Withdrawn 2008)
Available format(s)

Hardcopy , PDF

Withdrawn date

07-30-2008

Language(s)

English

Published date

12-10-2002

CONTAINED IN VOL. 10.04, 2006 Covers procedures that will normally detect and locate the sites of gross leaks in electron devices.

1.1 These practices cover procedures that will normally detect and locate the sites of gross leaks in electron devices.

1.2 These procedures are suitable for use on selected parts during receiving inspection or to verify and locate leakage sites for production control. They are not quantitative; no indication of leak size can be inferred from the test.

1.3 These procedures are most suitable for use on transparent glass-encased devices; all methods are applicable to transparent parts with an internal cavity. Method A, Penetrant-Capillary, is also applicable to parts, such as terminals, end seals or base assemblies, without an internal cavity, and Method C, Penetrant-Pressure Followed by Vacuum, can be used on opaque parts with an internal cavity. Method B, Penetrant-Pressure, can also be used on opaque parts with an internal cavity if the part is opened after dye penetration and before inspection. Parts that have an internal cavity may either contain gas (such as air, nitrogen, nitrogen-helium mixture, etc.) or be evacuated. These procedures are not suitable for use on grease-filled components.

1.4 Because of the possibility of dye entrapment between the component and an attached part, components with mechanically attached parts, such as a radiator on a power transistor, should be tested before the attachment is made or after it has been removed.

Note 1—Alternative methods for determining hermeticity of electron devices may be found in Practices F 98 (see 2.1) and Test Methods F 134 (see 2.1).

1.5 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.

1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific hazard statement, see Section 8.

Committee
F 01
DocumentType
Standard Practice
Pages
3
ProductNote
Reconfirmed EDT 1
PublisherName
American Society for Testing and Materials
Status
Withdrawn
Supersedes

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
ASTM F 134 : 1985 RECOMMENDED PRACTICES FOR DETERMINING HERMETICITY OF ELECTRON DEVICES WITH A HELIUM MASS SPECTROMETER LEAK DETECTOR
ASTM F 98 : 1972 : R1977 Recommended Practices for Determining Hermeticity of Electron Devices by a Bubble Test (Withdrawn 1990)
MIL-STD-105 Revision E:1989 SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES

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