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BS EN 60747-5-2:2001

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Available format(s)

Hardcopy , PDF

Superseded date

06-30-2015

Language(s)

English

Published date

01-17-2003

Publisher

British Standards Institution

FOREWORD
1 Scope
2 Normative references
3 Light-emitting diodes (excluding devices for fibre
   optic systems or subsystems)
   3.1 Type
   3.2 Semiconductor material
   3.3 Colour
   3.4 Details of outline and encapsulation
   3.5 Limiting values (absolute maximum system)
   3.6 Electrical characteristics
   3.7 Supplementary information
4 Infrared-emitting diodes (excluding devices for fibre
   optic systems or subsystems)
   4.1 Type
   4.2 Semiconductor material
   4.3 Details of outline and encapsulation
   4.4 Limiting values (absolute maximum system)
   4.5 Electrical characteristics
   4.6 Supplementary information
5 Photodiodes (excluding devices for fibre optic systems or
   subsystems)
   5.1 Type
   5.2 Semiconductor material
   5.3 Details of outline and encapsulation
   5.4 Limiting values (absolute maximum system)
   5.5 Electrical characteristics
   5.6 Supplementary information
6 Phototransistors (excluding devices for fibre optic
   systems or subsystems)
   6.1 Type
   6.2 Semiconductor material
   6.3 Polarity
   6.4 Details of outline and encapsulation
   6.5 Limiting values (absolute maximum system)
   6.6 Electrical characteristics
   6.7 Supplementary information
7 Photocouplers, optocouplers (with output transistor)
   7.1 Type
   7.2 Semiconductor material
   7.3 Polarity of the output resistor
   7.4 Details of outline and encapsulation
   7.5 Limiting values (absolute maximum system)
   7.6 Electrical characteristics
   7.7 Supplementary information
8 Photocouplers (optocouplers) providing protection
   against electrical shock
   8.1 Type
   8.2 Semiconductor material
   8.3 Details of outline and encapsulation
   8.4 Ratings
   8.5 Electrical characteristics
   8.6 Electrical, environmental and/or endurance
        information (supplementary information)
9 Laser diodes
   9.1 Type
   9.2 Semiconductor
   9.3 Details of outline and encapsulation
   9.4 Limiting values (absolute maximum system)
   9.5 Electrical and optical characteristics
   9.6 Supplementary information
Annexes
A (informative) Cross references index
B (normative) Input/output safety test
Figures
Tables

Provides essential ratings and characteristics of several categories or subcategories of optoelectronic devices not intended for use in the area of fibre optic systems or subsystems.

Committee
EPL/47
DevelopmentNote
To be read in conjunction with IEC 60747-1, IEC 62007-1 and IEC 62007-2 Renumbers and supersedes BS IEC 60747-5.2 2001 Version incorporates amendment 13433 to BS IEC 60747-5.2 (01/2002) Supersedes 00/202968 DC (02/2003)
DocumentType
Standard
Pages
34
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

IEC 60112:2003+AMD1:2009 CSV Method for the determination of the proof and the comparative tracking indices of solid insulating materials
IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
HD 214 : 200S2 RECOMMENDED METHOD FOR DETERMINING THE COMPARATIVE TRACKING INDEX OF SOLID INSULATING MATERIALS UNDER MOIST CONDITIONS
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
EN 60065:2014/AC:2017-01 AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014/COR2:2016)
EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
HD 625.1 : 200S1 INSULATION COORDINATION FOR EQUIPMENT WITHIN LOW-VOLTAGE SYSTEMS - PRINCIPLES, REQUIREMENTS AND TESTS
EN 60747-5-3:2001/A1:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS
IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 60216-2:2005 Electrical insulating materials - Thermal endurance properties - Part 2: Determination of thermal endurance properties of electrical insulating materials - Choice of test criteria
EN 60747-5-1:2001/A2:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-1: OPTOELECTRONIC DEVICES - GENERAL
HD 611.1 : 200S1 GUIDE FOR THE DETERMINATION OF THERMAL ENDURANCE PROPERTIES OF ELECTRICAL INSULATING MATERIALS - GENERAL GUIDELINES FOR AGEING PROCEDURES AND EVALUATION OF TEST RESULTS
IEC 60747-5-3:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
EN 60068-2-17:1994 Environmental testing - Part 2: Tests - Test Q: Sealing
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60672-2:1999 Ceramic and glass insulating materials - Part 2: Methods of test
EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
EN 60651:1994/A2:2001 SOUND LEVEL METERS (IEC 60651:1979/A2:2000)
EN 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
HD 323.2.2 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST B: DRY HEAT
HD 426.2 : 200S1 SPECIFICATION FOR CERAMIC AND GLASS INSULATING MATERIALS - METHODS OF TEST
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
HD 611.2 : 200S1 GUIDE FOR THE DETERMINATION OF THERMAL ENDURANCE PROPERTIES OF ELECTRICAL INSULATING MATERIALS - CHOICE OF TEST CRITERIA
IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60216-1:2013 Electrical insulating materials - Thermal endurance properties - Part 1: Ageing procedures and evaluation of test results
EN 60695-2-2:1994/A1:1995 FIRE HAZARD TESTING - TEST METHODS - NEEDLE-FLAME TEST
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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