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BS EN 61967-4 : 2002

Current
Current

The latest, up-to-date edition.

INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2002

1 Scope
2 Normative references
3 Definitions
4 General
  4.1 Measurement basics
  4.2 RF current measurement
  4.3 RF voltage measurement at IC pins
  4.4 Assessment of the measurement technique
5 Test conditions
6 Test equipment
  6.1 Test receiver specification
  6.2 RF current probe specification
  6.3 Test of the RF current probe capability
  6.4 Matching network specification
7 Test set-up
  7.1 General test configuration
  7.2 Printed circuit test board layout
8 Test procedure
9 Test report
Annex A (normative) Probe calibration procedure
Annex B (informative) Classification of conducted emission
        levels
  B.1 Introductory remark
  B.2 General
  B.3 Definition of emission levels
  B.4 Presentation of results
Annex C (informative) Example of reference levels for
        automotive applications
  C.1 Introductory remark
  C.2 General
  C.3 Reference level
Annex D (informative) EMC requirements and how to use
        EMC IC measurement techniques
  D.1 Introduction
  D.2 Using EMC measurement procedures
  D.3 Assessment of the IC influence to the EMC behaviour
      of the modules
Annex E (informative) Example of a test set-up consisting
        of an EMC main test board and an EMC IC test board
  E.1 The EMC main test board
  E.2 EMC IC test board
Annex F (informative) 150 ohms direct coupling networks for
        common mode emission measurements of differential
        mode data transfer ICs and similar circuits
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network.

Committee
EPL/47
DevelopmentNote
Supersedes 98/232942 DC (09/2002)
DocumentType
Standard
Pages
36
PublisherName
British Standards Institution
Status
Current
Supersedes

IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
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CISPR 16-1-5:2014+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-5: Radio disturbance and immunity measuring apparatus - Antenna calibration sites and reference test sites for 5 MHz to 18 GHz
EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 61000-4-6 : 4.0 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS
IEC 61000-4-6:2013 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
EN 61000-4-6:2014/AC:2015 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS (IEC 61000-4-6:2013)
CISPR 16-1:1999+AMD1:2002 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus

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