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BS IEC 60747-4.2 : 2000

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION
Available format(s)

Hardcopy , PDF

Withdrawn date

04-25-2012

Language(s)

English

Published date

01-01-2000

Committee
EPL/47
DevelopmentNote
Supersedes 97/204800 DC (05/2005) Also numbered as BS QC750116(2000). (07/2005)
DocumentType
Standard
Pages
20
PublisherName
British Standards Institution
Status
Withdrawn
Supersedes

Standards Relationship
IEC 60747-4-2:2000 Identical

IEC 60747-4:2007+AMD1:2017 CSV Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
IEC 60748-11:1990 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General

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