Name: BS IEC 60747-5.2 : 97 AMD 13433
Brand: BSI

BS IEC 60747-5.2 : 97 AMD 13433

Superseded

View Superseded by

DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS

Superseded date

01-08-2002

Published date

11-23-2012

Publisher

British Standards Institution

FOREWORD
1 Scope
2 Normative references
3 Light-emitting diodes (excluding devices for fibre
    optic systems or subsystems)
    3.1 Type
    3.2 Semiconductor material
    3.3 Colour
    3.4 Details of outline and encapsulation
    3.5 Limiting values (absolute maximum system)
    3.6 Electrical characteristics
    3.7 Supplementary information
4 Infrared-emitting diodes (excluding devices for fibre
    optic systems or subsystems)
    4.1 Type
    4.2 Semiconductor material
    4.3 Details of outline and encapsulation
    4.4 Limiting values (absolute maximum system)
    4.5 Electrical characteristics
    4.6 Supplementary information
5 Photodiodes (excluding devices for fibre optic systems or
    subsystems)
    5.1 Type
    5.2 Semiconductor material
    5.3 Details of outline and encapsulation
    5.4 Limiting values (absolute maximum system)
    5.5 Electrical characteristics
    5.6 Supplementary information
6 Phototransistors (excluding devices for fibre optic
    systems or subsystems)
    6.1 Type
    6.2 Semiconductor material
    6.3 Polarity
    6.4 Details of outline and encapsulation
    6.5 Limiting values (absolute maximum system)
    6.6 Electrical characteristics
    6.7 Supplementary information
7 Photocouplers, optocouplers (with output transistor)
    7.1 Type
    7.2 Semiconductor material
    7.3 Polarity of the output resistor
    7.4 Details of outline and encapsulation
    7.5 Limiting values (absolute maximum system)
    7.6 Electrical characteristics
    7.7 Supplementary information
8 Photocouplers (optocouplers) providing protection
    against electrical shock
    8.1 Type
    8.2 Semiconductor material
    8.3 Details of outline and encapsulation
    8.4 Ratings
    8.5 Electrical characteristics
    8.6 Electrical, environmental and/or endurance
          information (supplementary information)
9 Laser diodes
    9.1 Type
    9.2 Semiconductor
    9.3 Details of outline and encapsulation
    9.4 Limiting values (absolute maximum system)
    9.5 Electrical and optical characteristics
    9.6 Supplementary information
Annexes
A (informative) Cross references index
B (normative) Input/output safety test

Provides the essential ratings and characteristics of several categories or subcategories of optoelectronic devices not intended for use in the area of fibre optic systems or subsystems.

Committee	EPL/47/3
DevelopmentNote	Renumbered and superseded by BS EN 60747-5-2 (01/2002)
DocumentType	Standard
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 60747-5-2:2001

Standards	Relationship
IEC 60747-5-2:1997+AMD1:2002 CSV	Identical

IEC 60068-2-27:2008	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60747-5-3:1997+AMD1:2002 CSV	Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
IEC 60306-1:1969	Measurement of photosensitive devices - Part 1: Basic recommendations
IEC 60068-2-3:1969	Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
IEC 60068-2-17:1994	Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-2:2007	Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV	Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-30:2005	Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)