Semiconductor devices Discrete devices. Thyristors

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

04-30-2016

Publisher

British Standards Institution

IEC 60747-6:2016 provides standards for the following types of discrete semiconductor devices:
- reverse-blocking triode thyristors;
- reverse-conducting (triode) thyristors;
- bidirectional triodethyristors (triacs);
- turn-off thyristors.
This edition includes the following significant technical changes with respect to the previous edition:
a) Clauses 3, 4, 5, 6, and 7 were amended with some deletions of information no longer in use or already included in other parts of the IEC 60747 series, and with some necessary additions;
b) some parts of Clause 8 and Clause 9 were moved and added to Clause 7 of this third edition;
c) Clause 8 and 9 were deleted in this third edition;
d) Annex A was deleted.

This publication is to be read in conjunction with IEC 60747-1:2006.

Committee	EPL/47
DevelopmentNote	Supersedes BS 6493-1.6(1984) (05/2001) Supersedes 94/204766 DC. (06/2005) Supersedes 13/30270189 DC. (05/2016)
DocumentType	Standard
Pages	128
PublisherName	British Standards Institution
Status	Current
Supersedes	13/30270189 DC : 0 BS 6493-1.6:1984 94/204766 DC : DRAFT APR 1994 BS IEC 60747-6:2000

Standards	Relationship
IEC 60747-6:2016	Identical

IEC 60749-25:2003	Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749-34:2010	Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
IEC 60050-521:2002	International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
IEC 60050-113:2011	International Electrotechnical Vocabulary (IEV) - Part 113: Physics for electrotechnology
IEC 60749-23:2004+AMD1:2011 CSV	Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life