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BS IEC 60747-9:2007

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Semiconductor devices. Discrete devices Insulated-gate bipolar transistors (IGBTs)
Available format(s)

Hardcopy , PDF

Superseded date

11-22-2019

Language(s)

English

Published date

11-30-2007

1 Scope
2 Normative references
3 Terms and definitions
  3.1 Graphical symbol of IGBT
  3.2 General terms
  3.3 Terms related to ratings and characteristics;
      voltages and currents
  3.4 Terms related to ratings and characteristics;
      other characteristics
4 Letter symbols
  4.1 General
  4.2 Additional general subscripts
  4.3 List of letter symbols
5 Essential ratings and characteristics
  5.1 Ratings (limiting values)
  5.2 Characteristics
6 Measuring methods
  6.1 General
  6.2 Verification of ratings (limiting values)
  6.3 Methods of measurement
7 Acceptance and reliability
  7.1 General requirements
  7.2 Specific requirements
  7.3 Type tests and routine tests
Annex A (normative) Measuring method for collector-emitter
                    breakdown voltage
Annex B (normative) Measuring method for inductive load
                    turn-off current under specified conditions
Annex C (normative) Forward biased safe operating area (FBSOA)
Annex D (normative) Case non-rupture
Bibliography

Provides product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs).

This part of IEC 60747 gives product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs). The major changes with respect to the previous edition are mainly of an editorial nature.

Committee
EPL/47
DevelopmentNote
Supersedes 93/200600 DC. (01/2003) Supersedes 98/231398 DC. (05/2005) Supersedes 04/30113287 DC. (11/2007)
DocumentType
Standard
Pages
60
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
IEC 60747-9:2007 Identical

IEC 60747-7:2010 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

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