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PD IEC/PAS 62276:2002

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
Available format(s)

Hardcopy , PDF

Superseded date

02-14-2006

Language(s)

English

Published date

02-05-2002

Publisher

British Standards Institution

Introduction
Section 1: Specification for single crystal wafer
1 Scope
2 Reference documents
3 Terms and definitions
4 Symbols and abbreviated terms
5 Requirements
6 Sampling
7 Test methods
8 Identification, labeling, packaging, delivery condition
Section 2: Measuring method
1 Measuring method of Curie Temperature
2 Measurement of lattice constant (Bond method)
3 Measurement of face angle by X-ray
4 Appearance inspections
Annex A (Normative) Expression using Eulerian angle for
        piezoelectric Single crystal
Annex B (Informative) Crystal growth method
Annex C (Informative) Manufacturing lot
Annex D (Informative) Explanation of TTV, LTV and Sori
Annex E (Informative) Standard mechanical wafer process
        flow chart
Annex F (Informative) Reference

Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators.

Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and measuring methods.

Committee
W/-
DevelopmentNote
Also numbered as IEC PAS 62276. (02/2002)
DocumentType
Standard
Pages
40
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 61019-1-2:1993 Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
IEC 61019-3:1991 Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
IEC 61019-1-1:1990 Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values

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Hardcopy - English
PDF - English
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