CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 16-7: MECHANICAL TESTS ON CONTACTS AND TERMINATIONS - TEST 16G: MEASUREMENT OF CONTACT DEFORMATION AFTER CRIMPING

Available format(s)

Hardcopy , PDF

Language(s)

English - Italian

Published date

01-01-2010

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1. Scope and object
2. Normative references
3. Preparations
4. Test procedure
5. Measurements and requirements
6. Details to be specified
Annex ZA (normative) - Normative references
                       to international publications
                       with their corresponding
                       European publications

Describes the detail specification, is used for testing connectors within the scope of IEC technical committee 48.

Committee	CT 48
DevelopmentNote	Classificazione CEI 48-162. To be read in conjunction with EN 60512-1 and EN 60512-1-100. (12/2009)
DocumentType	Standard
Pages	18
PublisherName	Comitato Elettrotecnico Italiano
Status	Current

Standards	Relationship
IEC 60512-16-7:2008	Identical
EN 60512-16-7 : 2008	Identical

IEC 60512-1-1:2002	Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination
IEC 60352-2:2006+AMD1:2013 CSV	Solderless connections - Part 2: Crimped connections - Generalrequirements, test methods and practical guidance
EN 60512-1-1:2002	Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination

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CEI EN 60512-16-7 : 2010

CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 16-7: MECHANICAL TESTS ON CONTACTS AND TERMINATIONS - TEST 16G: MEASUREMENT OF CONTACT DEFORMATION AFTER CRIMPING

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Abstract

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International Equivalents

Standards Referencing This Book

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