CEI EN 60512-25-3 : 2003
Current
Current
The latest, up-to-date edition.
CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENT - PART 25-3: TEST 25C - RISE TIME DEGRADATION
Available format(s)
Hardcopy , PDF
Language(s)
English - Italian
Published date
01-01-2003
Publisher
FOREWORD
1. GENERAL
2. TEST RESOURCES
3. TEST SPECIMEN
4. TEST PROCEDURE
5. DETAILS TO BE SPECIFIED
6. TEST DOCUMENTATION
ANNEX A - DIAGRAMS AND SCHEMATICS
OF FIXTURES AND EQUIPMENT
ANNEX B - PRACTICAL GUIDANCE
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