DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS

Available format(s)

Hardcopy , PDF

Language(s)

English - French, English

Published date

01-01-2002

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Light-emitting diodes (excluding
  devices for fibre optic
  systems or subsystems)
4 Infrared-emitting diodes
  (excluding devices for fibre
  optic systems or subsystems)
5 Photodiodes (excluding
  devices for fibre optic
  systems or subsystems)
6 Phototransistors (excluding
  devices for fibre optic
  systems or subsystems)
7 Photocouplers, optocouplers
  (with output transistor)
8 Photocouplers (optocouplers)
  providing protection against
  electrical shock
9 Laser diodes
Annex A (informative) - Cross
        references table
Annex B (normative) - Input/output
        safety test

Defines the essential ratings and characteristics of the following categories or subcategories of optoelectronic devices which are not intended to be used in the field of fibre optic systems or subsystems.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-1012. (08/2015)
DocumentType	Standard
Pages	42
PublisherName	Comitato Elettrotecnico Italiano
Status	Current

Standards	Relationship
EN 60747-5-2:2001/A1:2002	Identical

IEC 60112:2003+AMD1:2009 CSV	Method for the determination of the proof and the comparative tracking indices of solid insulating materials
HD 214 : 200S2	RECOMMENDED METHOD FOR DETERMINING THE COMPARATIVE TRACKING INDEX OF SOLID INSULATING MATERIALS UNDER MOIST CONDITIONS
IEC 60068-2-27:2008	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
EN 60065:2014/AC:2017-01	AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014/COR2:2016)
EN 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
HD 625.1 : 200S1	INSULATION COORDINATION FOR EQUIPMENT WITHIN LOW-VOLTAGE SYSTEMS - PRINCIPLES, REQUIREMENTS AND TESTS
EN 60747-5-3:2001/A1:2002	DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS
IEC 60216-2:2005	Electrical insulating materials - Thermal endurance properties - Part 2: Determination of thermal endurance properties of electrical insulating materials - Choice of test criteria
EN 60747-5-1:2001/A2:2002	DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-1: OPTOELECTRONIC DEVICES - GENERAL
HD 611.1 : 200S1	GUIDE FOR THE DETERMINATION OF THERMAL ENDURANCE PROPERTIES OF ELECTRICAL INSULATING MATERIALS - GENERAL GUIDELINES FOR AGEING PROCEDURES AND EVALUATION OF TEST RESULTS
IEC 60747-5-3:1997+AMD1:2002 CSV	Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
IEC 60306-1:1969	Measurement of photosensitive devices - Part 1: Basic recommendations
EN 60068-2-27:2009	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
HD 323.2.3 : 200S2	BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
IEC 60068-2-3:1969	Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
EN 60068-2-17:1994	Environmental testing - Part 2: Tests - Test Q: Sealing
IEC 60068-2-17:1994	Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-2:2007	Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60672-2:1999	Ceramic and glass insulating materials - Part 2: Methods of test
EN 60068-2-6:2008	Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV	Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
EN 60068-2-30:2005	Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
HD 323.2.2 : 200S1	BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST B: DRY HEAT
HD 426.2 : 200S1	SPECIFICATION FOR CERAMIC AND GLASS INSULATING MATERIALS - METHODS OF TEST
IEC 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature
HD 611.2 : 200S1	GUIDE FOR THE DETERMINATION OF THERMAL ENDURANCE PROPERTIES OF ELECTRICAL INSULATING MATERIALS - CHOICE OF TEST CRITERIA
IEC 60664-1:2007	Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
EN 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60216-1:2013	Electrical insulating materials - Thermal endurance properties - Part 1: Ageing procedures and evaluation of test results
EN 60695-2-2:1994/A1:1995	FIRE HAZARD TESTING - TEST METHODS - NEEDLE-FLAME TEST
IEC 60068-2-30:2005	Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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CEI EN 60747-5-2 : 2002

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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