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CEI EN 62506 : 2014

Current
Current

The latest, up-to-date edition.

METHODS FOR PRODUCT ACCELERATED TESTING
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2014

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, symbols and abbreviations
4 General description of the accelerated test methods
5 Accelerated test models
6 Accelerated testing strategy in product development
7 Limitations of accelerated testing methodology
Annex A (informative) - Highly accelerated limit
        test (HALT)
Annex B (informative) - Accelerated reliability
        compliance and growth test design
Annex C (informative) - Comparison between
        HALT and conventional accelerated testing
Annex D (informative) - Estimating the activation
        energy, E[a]
Annex E (informative) - Calibrated accelerated
        life testing (CALT)
Annex F (informative) - Example on how to
        estimate empirical factors
Annex G (informative) - Determination of acceleration
        factors by testing to failure
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Gives guidance on the application of various accelerated test techniques for measurement or improvement of product reliability.

Committee
CT 56
DevelopmentNote
Classificazione CEI 56-69. (04/2014)
DocumentType
Standard
Pages
96
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 62506:2013 Identical
EN 62506 : 2013 Identical

IEC 61125:1992 Unused hydrocarbon based insulating liquids - Test methods for evaluating the oxidation stability
IEC 61649:2008 Weibull analysis
IEC 61014:2003 Programmes for reliability growth
IEC 62429:2007 Reliability growth - Stress testing for early failures in unique complex systems
IEC 62303:2008 Radiation protection instrumentation - Equipment for monitoring airborne tritium
EN 60300-3-1:2004 Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology
EN 61649:2008 Weibull analysis
IEC TR 62380:2004 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
IEC 61163-2:1998 Reliability stress screening - Part 2: Electronic components
EN 61710:2013 Power law model - Goodness-of-fit tests and estimation methods
IEC 61124:2012 Reliability testing - Compliance tests for constant failure rate and constant failure intensity
EN 62429:2008 Reliability growth - Stress testing for early failures in unique complex systems
IEC 61164:2004 Reliability growth - Statistical test and estimation methods
IEC 60605-2:1994 Equipment reliability testing - Part 2: Design of test cycles
IEC 61709 : 3.0 ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION
EN 61014 : 2003 Programmes for reliability growth
EN 61709:2017 Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
EN 61164:2004 Reliability growth - Statistical test and estimation methods
EN 61124:2012 RELIABILITY TESTING - COMPLIANCE TESTS FOR CONSTANT FAILURE RATE AND CONSTANT FAILURE INTENSITY (IEC 61124:2012)
IEC 61710:2013 Power law model - Goodness-of-fit tests and estimation methods
IEC 60300-3-5:2001 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles

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