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CEI EN 62979 : 1ED 2018

Current
Current

The latest, up-to-date edition.

PHOTOVOLTAIC MODULE - BYPASS DIODE - THERMAL RUNAWAY TEST
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

05-13-2018

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Thermal runaway test
6 Test report
Annex ZA (normative) - Normative references
                       to international publications
                       with their corresponding
                       European publications

This document provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.

Committee
CT 82
DevelopmentNote
Classificazione CEI 82-77. (05/2018)
DocumentType
Standard
Pages
0
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
EN 62979:2017 Identical

IEC TS 61836:2007 Solar photovoltaic energy systems - Terms, definitions and symbols

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