INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 3: BULK CURRENT INJECTION (BCI) METHOD

Available format(s)

Hardcopy , PDF

Language(s)

German

Published date

01-01-2008

Publisher

German Institute for Standardisation (Deutsches Institut für Normung)

1 Scope and object
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
   5.1 General
   5.2 Test equipment
   5.3 Test board
6 Test procedure
   6.1 Hazardous electromagnetic fields
   6.2 Calibration of forward power limitation
   6.3 BCI test
   6.4 BCI test set-up characterization procedure
7 Test report
Annex A (informative) Examples for test levels and frequency
                      step selection
Annex B (informative) Example of BCI test board and set-up
Annex C (informative) Example of RF test board and set-up
Annex ZA (normative) Normative references to international
                      publications with their corresponding
                      European publications
Bibliography

Explains a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.

DevelopmentNote	Supersedes DIN IEC 62132-3. (04/2008)
DocumentType	Standard
Pages	21
PublisherName	German Institute for Standardisation (Deutsches Institut für Normung)
Status	Current
Supersedes	DIN IEC 62132-3:2003-09 (Draft)

Standards	Relationship
EN 62132-3 : 2007	Identical
IEC 62132-3:2007	Identical
NF EN 62132-3 : 2008	Identical
BS EN 62132-3:2007	Identical
I.S. EN 62132-3:2007	Identical