Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

Published date

11-17-2017

Publisher

European Committee for Standards - Electrical

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and general information
4 Quality assessment procedures
Annex A (normative) - Load circuit for logic drive
Annex B (normative) - Latch-up test
Annex C (normative) - Electrostatic discharge
        sensitivity classification
Annex D (normative) - Digital interfaced crystal
        Oscillator's function
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 60679-1:2017(E) specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures.

DevelopmentNote	Supersedes EN 169000 (05/2001)
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current
Supersedes	EN 60679-1:2007

Standards	Relationship
NBN EN 60679-1 : 2007	Identical
I.S. EN 60679-1:2007	Identical
CEI EN 60679-1 : 3ED 2018	Identical
IEC 60679-1:2017	Identical
BS EN 60679-1:2007	Identical
SN EN 60679-1 : 1998 AMD 2 2003	Identical
CEI EN 60679-1 : 2009	Identical
DIN EN 60679-1:2013-08 (Draft)	Identical
NF EN 60679-1 : 2013	Identical
UNE-EN 60679-1:2017	Identical
NF EN 60679-1:2017	Identical
BS EN 60679-1:2017	Identical

IEC 62884-1:2017	Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
EN 60469:2013	Transitions, pulses and related waveforms - Terms, definitions and algorithms
EN ISO 80000-1:2013	Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011)
ATIS 0900101 : 2013	SYNCHRONIZATION INTERFACE STANDARD
IEC 60068-2-27:2008	Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
EN 61340-5-1:2016/AC:2017-05	ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017)
EN 62884-1:2017	Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
IEC 61837-1:2012	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
IEC 61340-5-1:2016	Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC 60679-4:1997	Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
IEC 60469:2013	Transitions, pulses and related waveforms - Terms, definitions and algorithms
IEC TR 61000-4-1:2016	Electromagnetic compatibility (EMC) - Part 4-1: Testing and measurement techniques - Overview of IEC 61000-4 series
IEC 61837-2:2011+AMD1:2014 CSV	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
IEC 60679-5:1998	Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
IEC 61837-4:2015	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
IEC 60749-27:2006+AMD1:2012 CSV	Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
IEC 61019-1:2004	Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 60068-2-64:2008	Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
ATIS 0900105.03 : 2013	SYNCHRONOUS OPTICAL NETWORK - (SONET) - JITTER NETWORK INTERFACES
GR 253 CORE : ISSUE 5	SYNCHRONOUS OPTICAL NETWORK (SONET) TRANSPORT SYSTEMS: COMMON GENERIC CRITERIA
IEC 61837-3:2015	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
EN 60749-27:2006/A1:2012	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
IEC 61019-2:2005	Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60749-26:2013	Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60068-2-17:1994	Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
ISO 80000-1:2009	Quantities and units — Part 1: General
IEC 60050-561:2014	International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60122-1:2002	Quartz crystal units of assessed quality - Part 1: Generic specification
EN 60749-26:2014	Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60748-2:1997	Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60679-3:2012	Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-2:1981	Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
MIL-PRF-55310 Revision E:2006	OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR