Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Published date

04-13-2018

Publisher

European Committee for Standards - Electrical

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications

IEC60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.The salt atmosphere test is considered destructive.This edition includes the following significant technical changes with respect to the previous edition:a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Committee	CLC/SR 47
DevelopmentNote	Supersedes & Redesignates EN 60749-13. (04/2018)
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current
Supersedes	EN 60749-13:2002

Standards	Relationship
IEC 60749-13:2002	Identical
UNE-EN IEC 60749-13:2018	Identical
CEI EN IEC 60749-13 : 2018	Identical
OVE EN IEC 60749-13: 2018 11 01	Identical
BS EN IEC 60749-13:2018	Identical
PN-EN IEC 60749-13:2018-11	Identical

MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
IEC 60749-14:2003	Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
EN 60749-14:2003	Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)