ESD SP5.3.2 : 2013
Current
The latest, up-to-date edition.
ELECTROSTATIC DISCHARGE SENSITIVITY TESTING - SOCKETED DEVICE (SDM) - COMPONENT LEVEL
01-12-2013
1.0 PURPOSE AND SCOPE
1.1 PURPOSE
1.2 SCOPE
2.0 REFERENCES
3.0 DEFINITIONS
4.0 REQUIRED EQUIPMENT
4.1 SOCKETED DEVICE MODEL (SDM) ESD TESTER
4.2 WAVEFORM VERIFICATION EQUIPMENT
5.0 EQUIPMENT CALIBRATION AND VERIFICATION
REQUIREMENTS
5.1 EQUIPMENT CALIBRATION
5.2 TESTER VERIFICATION
6.0 EQUIPMENT QUALIFICATION AND VERIFICATION
PROCEDURES
6.1 WAVEFORM VERIFICATION PROCEDURE
6.2 TESTER QUALIFICATION AND RE-QUALIFICATION
PROCEDURE
6.3 RECOMMENDED TESTER FUNCTIONALITY CHECK
7.0 SDM TESTING RECOMMENDATIONS
7.1 COMPONENT HANDLING
7.2 COMPONENT STATIC AND DYNAMIC TESTS
7.3 TEST TEMPERATURE
7.4 SAMPLE SIZE
7.5 PIN STRESSING
8.0 SDM ESD STRESS TESTING PROCEDURE
8.1 TEST PRACTICE
9.0 FAILURE CRITERIA
10.0 SDM WAVEFORM PARAMETERS
ANNEX A: WAVEFORM VERIFICATION LIMIT PROCEDURE
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