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GEIA SSB 1.002 : 1999

GEIA SSB 1.002 : 1999

Current

Current

The latest, up-to-date edition.

ENVIRONMENTAL TESTS AND ASSOCIATED FAILURE MECHANISMS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-1999

Publisher

Government Electronics & Information Technology Association

1 Scope
2 Reference Documents
3 Environmental Tests and Associated Failure
  Mechanisms

Gives reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors, and the specific failures induced by these environmental stresses.

Committee
SSTCG12
DevelopmentNote
Annex to GEIA SSB 1. (12/2005)
DocumentType
Standard
Pages
16
PublisherName
Government Electronics & Information Technology Association
Status
Current

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Hardcopy - English
PDF - English
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