Customer Support: +1 416-401-8730

Login to i2i Subscription Intertek.com
  • There are no items in your cart
Please enter a keyword to search
Advanced search

GEIA SSB 1.003 : 2002

Current
Current

The latest, up-to-date edition.

ACCELERATION FACTORS
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2002

Publisher

Government Electronics & Information Technology Association

1 Scope
2 Reference Documents
3 Thermal Effects (Arrhenius)
4 Temperature - Humidity Effects (Hallberg - Peck)
5 Thermo-mechanical Effects (Coffin-Manson)

Gives reference information concerning acceleration factors commonly used by device manufacturers to model failure rates in conjunction with statistical reliability monitoring.

Committee
SSTCG12
DevelopmentNote
Annex to GEIA SSB 1. (12/2005)
DocumentType
Standard
Pages
22
PublisherName
Government Electronics & Information Technology Association
Status
Current

GEIA SSB 1.004 : 2009 FAILURE RATE ESTIMATING
GEIA SSB 1 : 2000 GUIDELINES FOR USING PLASTIC ENCAPSULATED MICROCIRCUITS AND SEMICONDUCTORS IN MILITARY, AEROSPACE AND OTHER RUGGED APPLICATIONS

IPC SM 785 : 0 GUIDELINES FOR ACCELERATED RELIABILITY TESTING OF SURFACE MOUNT ATTACHMENTS

View more information
US$76.00
Excluding Tax where applicable
USD
CAD
CHF
CNY
DKK
EUR
GBP
HKD
IDR
INR
JPY
KRW
MXN
NOK
NZD
SEK
SGD
USD
ZAR
Hardcopy - English
PDF - English
01
02
03
04
05
06
07
08
09
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

or

Get in touch with us