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GEIA STD 0005-2 : 2012

Current
Current

The latest, up-to-date edition.

MITIGATING THE EFFECTS OF TIN WHISKERS IN AEROSPACE AND HIGH PERFORMANCE ELECTRONIC SYSTEMS
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2012

Foreword
Introduction
1 Scope
2 Terms and Definitions
3 Requirements
4 Implementation Methods
Annex A - Guidance on Control Levels, Risk Assessment,
          and Mitigation Evaluation
Annex B - Technical Guide on Detection Methods,
          Mitigation Methods, and Methods for Limiting Impact
          of Pb-free Tin Finishes
Annex C - Tin Whisker Inspection
Annex D - Analysis and Risk Assessment Guidance
Annex E - Whiskers Growing from Solder Joint Fillets
          and Bulk Solder
Annex F - Bibliography

Specifies processes for documenting the mitigating steps taken to reduce the harmful effects of Pb-free tin finishes in electronic systems.

Committee
G-12
DocumentType
Standard
Pages
79
PublisherName
Government Electronics & Information Technology Association
Status
Current

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IEC TS 62647-23:2013 Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 23: Rework and repair guidance to address the implications of lead-free electronics and mixed assemblies
PD IEC/TS 62647-23:2013 Process management for avionics. Aerospace and defence electronic systems containing lead-free solder Rework and repair guidance to address the implications of lead-free electronics and mixed assemblies
IEC TS 62647-22:2013 Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 22: Technical guidelines
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PD IEC/TS 62647-22:2013 Process management for avionics. Aerospace and defence electronic systems containing lead-free solder Technical guidelines

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