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I.S. EN 153000:1998

Current
Current

The latest, up-to-date edition.

DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION)
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-1998

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

1 General
2 Quality assessment procedures
3 Test and measurement procedures (general guidance)
Annex A General inspection requirements for rectifier
        diodes and thyristors
Annex B Additional electrical test methods
Annex C Screening
Annex D Dimensions
Annex E Direction of applied forces for mechanical tests
Figures

Applicable to discrete pressure contact power semiconductor devices known as rectifier diodes, transistors, thyristors and their derivatives. Also describes encapsulated assemblies. Not applicable to stacks or assemblies made from these encapsulated components.

DocumentType
Standard
Pages
44
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
SN EN 153000 : 1998 Identical
EN 153000:1998 Identical
DIN EN 153000:1999-01 Identical
NEN EN 153000 : 1998 Identical
BS EN 153000:1998 Identical

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