CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 6-2: DYNAMIC STRESS TESTS - TEST 6B: BUMP

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Hardcopy , PDF

Language(s)

English

Published date

01-01-2002

Publisher

National Standards Authority of Ireland

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Foreword
Endorsement notice
Annex ZA (normative) Normative references to
international publications with their
European publications

Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.

DevelopmentNote	For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType	Standard
Pages	22
PublisherName	National Standards Authority of Ireland
Status	Current

IEC 60512-7:1993	Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests
IEC 60512-2-5:2003	Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance
IEC 60512-1-1:2002	Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination
IEC 60512-2-1:2002	Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method
EN 60068-2-29:1993	Environmental testing - Part 2: Tests - Test Eb and guidance: Bump
IEC 60068-2-29:1987	Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
EN 60512-1-1:2002	Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination
EN 60512-2-1:2002	Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method

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Abstract