IEC 62884-1:2017
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
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EN 60469:2013
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Transitions, pulses and related waveforms - Terms, definitions and algorithms
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EN ISO 80000-1:2013
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Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011)
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ATIS 0900101 : 2013
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SYNCHRONIZATION INTERFACE STANDARD
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IEC 60068-2-27:2008
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
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EN 61340-5-1:2016/AC:2017-05
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ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017)
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EN 62884-1:2017
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
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IEC 61837-1:2012
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
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IEC 61340-5-1:2016
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Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
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IEC 60679-4:1997
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Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
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IEC 60469:2013
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Transitions, pulses and related waveforms - Terms, definitions and algorithms
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IEC TR 61000-4-1:2016
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Electromagnetic compatibility (EMC) - Part 4-1: Testing and measurement techniques - Overview of IEC 61000-4 series
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IEC 61837-2:2011+AMD1:2014 CSV
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
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IEC 60679-5:1998
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Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
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IEC 61837-4:2015
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
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IEC 60749-27:2006+AMD1:2012 CSV
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Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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IEC 61019-1:2004
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Surface acoustic wave (SAW) resonators - Part 1: Generic specification
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IEC 60068-2-64:2008
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Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
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ATIS 0900105.03 : 2013
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SYNCHRONOUS OPTICAL NETWORK - (SONET) - JITTER NETWORK INTERFACES
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IEC 61837-3:2015
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
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EN 60749-27:2006/A1:2012
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
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IEC 61019-2:2005
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Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
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IEC 60749-26:2013
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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IEC 60068-2-17:1994
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Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
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ISO 80000-1:2009
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Quantities and units — Part 1: General
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IEC 60050-561:2014
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International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
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IEC 60122-1:2002
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Quartz crystal units of assessed quality - Part 1: Generic specification
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EN 60749-26:2014
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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IEC 60748-2:1997
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Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
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IEC 60679-3:2012
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Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
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IEC 60679-2:1981
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Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
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MIL-PRF-55310 Revision E:2006
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OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
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