I.S. EN 61193-2:2007
Current
The latest, up-to-date edition.
QUALITY ASSESSMENT SYSTEMS - PART 2: SELECTION AND USE OF SAMPLING PLANS FOR INSPECTION OF ELECTRONIC COMPONENTS AND PACKAGES
Hardcopy , PDF
English
01-01-2007
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Sampling system
4.1 Formation and identification of lots
4.2 Drawing of samples
4.2.1 Selection of sample items
4.2.2 Process of sampling
4.3 Sampling plans
4.3.1 Inspection level
4.3.2 Sampling plan for normal inspection
4.3.3 Acceptance number
4.3.4 Tightened or reduced inspection
5 Acceptance and rejection
5.1 Acceptability criteria
5.2 Disposition of rejected lots
6 Statistical verified quality limit (SVQL)
6.1 General
6.2 Calculation of the SVQL
Annex A (informative) - Estimation of the statistical verified
quality limit (SVQL) in nonconforming
items per million (x10[-6]) at a confidence
limit 60 %
Annex B (informative) - Relationship between this standard and ISO
2859-1
Annex C (informative) - Example of application of this standard
(lot-by-lot inspection of assessment
level EZ in IEC/TC 40)
Annex ZA (normative) - Normative references to international
publications with their corresponding
European publications
Bibliography
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