INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 8: MEASUREMENT OF RADIATED IMMUNITY - IC STRIPLINE METHOD (IEC 62132-8:2012 (EQV))

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Hardcopy , PDF

Language(s)

English

Published date

01-01-2012

Publisher

National Standards Authority of Ireland

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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test setup
8 Test procedure
9 Test report
10 RF immunity acceptance level
Annex A (normative) - Field strength determination
Annex B (normative) - IC stripline descriptions
Annex C (informative) - Closed stripline geometrical
        limitations
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

DevelopmentNote	For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType	Standard
Pages	28
PublisherName	National Standards Authority of Ireland
Status	Current

Standards	Relationship
EN 62132-8 : 2012	Identical

EN 62132-1:2016	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 62132-1:2015	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 61000-4-20:2010	Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
EN 61000-4-20:2010	ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES

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I.S. EN 62132-8:2012

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Abstract

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