SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

Published date

05-06-2018

Publisher

National Standards Authority of Ireland

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

National Foreword
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications

Explains a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.

DevelopmentNote	Supersedes I.S. EN 60749-13. For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (05/2018)
DocumentType	Standard
PublisherName	National Standards Authority of Ireland
Status	Current

MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
IEC 60749-14:2003	Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
EN 60749-14:2003	Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

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I.S. EN IEC 60749-13:2018

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

Table of Contents

Abstract

General Product Information

Standards Referencing This Book

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