IEC 60749-26:2018
Current
The latest, up-to-date edition.
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
01-15-2018
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Apparatus and required equipment
5 Stress test equipment qualification and
routine verification
6 Classification procedure
7 Failure criteria
8 Component classification
Annex A (informative) - HBM test method flow
chart
Annex B (informative) - HBM test equipment
parasitic properties
Annex C (informative) - Example of testing a
product using Table 2, Table 3, or Table
with a two-pin HBM tester
Annex D (informative) - Examples of coupled
non-supply pin pairs
Annex E (normative) - Cloned non-supply (I/O)
pin sampling test method
Bibliography
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