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IEC 61967-1:2002

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

09-12-2022

Language(s)

English - French

Published date

03-12-2002

FOREWORD
1 Scope
2 Normative references
3 Definitions
4 Test conditions
   4.1 General
   4.2 Ambient conditions
        4.2.1 Ambient temperature
        4.2.2 Ambient RF field strength
        4.2.3 Other ambient conditions
        4.2.4 IC stability over time
5 Test equipment
   5.1 General
   5.2 Shielding
   5.3 RF measuring instrument
        5.3.1 Measuring receiver
        5.3.2 Spectrum analyzer
        5.3.3 Other RBW for narrowband disturbances
        5.3.4 Disturbance type, detector type and sweep
              speed
        5.3.5 Video bandwidth
        5.3.6 Verification of calibration for the RF
              measuring instrument
   5.4 Frequency range
   5.5 Pre-amplifier or attenuator
   5.6 System gain
   5.7 Other components
6 Test set-up
   6.1 General
   6.2 Test circuit board
   6.3 IC pin loading
   6.4 Power supply requirements - Test board power supply
   6.5 IC specific considerations
        6.5.1 IC supply voltage
        6.5.2 IC decoupling
        6.5.3 Activity of IC
        6.5.4 Guidelines regarding IC operation
7 Test procedure
   7.1 Ambient check
   7.2 Operational check
   7.3 Specific procedures
8 Test report
   8.1 General
   8.2 Ambient
   8.3 Description of device
   8.4 Description of set-up
   8.5 Description of software
   8.6 Data presentation
        8.6.1 Graphical presentation
        8.6.2 Software for data capture
        8.6.3 Data processing
   8.7 RF emission limits
   8.8 Interpretation of results
        8.8.1 Comparison between IC(s) using the same
              test method
        8.8.2 Comparison between different test methods
        8.8.3 Correlation to module test methods
9 General basic test board specification
   9.1 Board description - mechanical
   9.2 Board description - electrical characteristics
   9.3 Ground planes
   9.4 Pins
        9.4.1 DIL packages
        9.4.2 SOP, PLCC, QFP packages
        9.4.3 PGA, BGA packages
   9.5 Via type
   9.6 Via distance
   9.7 Additional components
        9.7.1 Supply decoupling
        9.7.2 I/O load
Annex A (informative) Test method comparison
Annex B (informative) Flow chart of an example counter
        test code
Annex C (informative) Prescription of a worst-case
        application software description
Bibliography
Figures

Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. Also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included to assist in selecting the appropriate measurement method(s). Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.

Committee
TC 47/SC 47A
DevelopmentNote
Also numbered as BS EN 61967-1 (07/2002) Stability Date: 2017. (10/2012)
DocumentType
Standard
Pages
47
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
DIN EN 61967-1:2003-01 Identical
NEN EN IEC 61967-1 : 2002 Identical
I.S. EN 61967-1:2002 Identical
CEI EN IEC 61967-1:2019 Identical
UNE-EN 61967-1:2002 Identical
CEI EN 61967-1 : 2002 Identical
EN 61967-1:2002 Identical
NF EN 61967-1 : 2002 Identical

BS EN 61967-8:2011 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
PD IEC/TR 61967-4-1:2005 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. 1 Ohm/150 Ohm direct coupling method. Application guidance to IEC 61967-4
03/112147 DC : DRAFT JULY 2003 IEC 61967-3 ED.1 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 3: MEASUREMENT OF RADIATED EMISSIONS - SURFACE SCAN METHOD
BS EN 61000-4-7 : 2002 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-7: TESTING AND MEASUREMENT TECHNIQUES - GENERAL GUIDE ON HARMONICS AND INTERHARMONICS MEASUREMENTS AND INSTRUMENTATION, FOR POWER SUPPLY SYSTEMS AND EQUIPMENT CONNECTED THERETO
PD IEC/TS 61967-3:2014 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
BS EN 62228-2:2017 Integrated circuits. EMC evaluation of transceivers LIN transceivers
I.S. EN 62132-1:2016 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS
ISO/IEC/IEEE 8802-3:2017 Information technology Telecommunications and information exchange between systems Local and metropolitan area networks Specific requirements Part 3: Standard for Ethernet
EN 61967-5:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
EN 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
EN 62433-3:2017 EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
I.S. EN 61967-4:2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
CEI EN 61967-2 : 2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
06/30152634 DC : DRAFT JULY 2006
NF EN 61000-4-7 : 2003 AMD 1 2009 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-7: TESTING AND MEASUREMENT TECHNIQUES - GENERAL GUIDE ON HARMONICS AND INTERHARMONICS MEASUREMENTS AND INSTRUMENTATION, FOR POWER SUPPLY SYSTEMS AND EQUIPMENT CONNECTED THERETO
09/30191130 DC : DRAFT FEB 2009 BS EN 61967-8 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
CEI EN 62228-2 : 1ED 2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
DD IEC TS 61967-3 : DRAFT JAN 2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - MEASUREMENT OF RADIATED EMISSIONS - SURFACE SCAN METHOD
CEI EN 62433-3 : 1ED 2017 EMC IC MODELLING - PART 3: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - RADIATED EMISSIONS MODELLING (ICEMRE)
ECMA/TR 93 : 1ED 2007 MEASURING EMISSIONS FROM MODULES
BS EN 61967-6 : 2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
I.S. EN 61967-8:2011 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD (IEC 61967-8:2011 (EQV))
I.S. EN 62228-2:2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
CEI EN 61967-4 : 2009 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
IEC TS 62239:2008 Process management for avionics - Preparation of an electronic components management plan
BS EN 61967-4 : 2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
EN IEC 62969-1:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
17/30350017 DC : 0 BS EN 62228-1 - INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 1: GENERAL CONDITIONS AND DEFINITIONS
CSA CEI/IEC 61000.4.7 : 2003(R2007) ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-7: TESTING AND MEASUREMENT TECHNIQUES - GENERAL GUIDE ON HARMONICS AND INTERHARMONICS MEASUREMENTS AND INSTRUMENTATION, FOR POWER SUPPLY SYSTEMS AND EQUIPMENT CONNECTED THERETO
14/30310470 DC : 0 BS EN 62228-2 - INTEGRATED CIRCUITS - EMC EVALUATION OF LIN TRANSCEIVERS
CEI EN 61967-8 : 2012 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
BS EN 61967-2:2005 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
BS EN 62132-1:2016 Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
IEC TS 62228:2007 Integrated circuits - EMC evaluation of CAN transceivers
I.S. EN 61967-5:2003 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 5: MEASUREMENT OF CONDUCTED EMISSIONS - WORKBENCH FARADAY CAGE METHOD
I.S. EN 62433-3:2017 EMC IC MODELLING - PART 3: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - RADIATED EMISSIONS MODELLING (ICEM-RE)
IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
IEC 61967-5:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
PD IEC/TR 61967-1-1:2015 Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
DD IEC/TS 62239:2003 Process management for avionics. Preparation of an electronic components management plan
BS EN 61967-5:2003 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Workbench Faraday Cage method
BS EN 62433-3:2017 EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
07/30163156 DC : 0 BS EN 62433-2 - MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - ICEM-CE, ICEM CONDUCTED EMISSION MODEL
12/30268333 DC : 0 BS EN 62132-1 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS
IEC TR 61967-1-1:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEEE 802.3-2012 IEEE Standard for Ethernet
NF EN 61967-4 : 2002 AMD 1 2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ - 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSION - 1 OHM/150 OHM DIRECT COUPLING METHOD
IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
EN 61967-6:2002/A1:2008 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
17/30365636 DC : 0 BS EN 62239-1 ED.1.0 - PROCESS MANAGEMENT FOR AVIONICS - MANAGEMENT PLAN - PART 1: PREPARATION AND MAINTENANCE OF AN ELECTRONIC COMPONENTS MANAGEMENT PLAN
PD IEC/TS 62239-1:2015 Process management for avionics. Management plan Preparation and maintenance of an electronic components management plan
IEC 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
IEC 62433-3:2017 EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
EN 61967-8 : 2011 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
I.S. EN 61967-6:2003 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
16/30336986 DC : 0 BS EN 62969-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS
DD IEC/TS 62228:2007 Integrated circuits. EMC evaluation of CAN transceivers
I.S. EN 61967-2:2005 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
IEC TR 61967-4-1:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
IEC TR 62014-3:2002 Electronic design automation libraries - Part 3: Models of integrated circuits for EMI behavioural simulation
EN 61967-4 : 2002 COR 2017 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017)
IEC 62228-2:2016 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
IEC 61967-8:2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
EN 62228-2:2017 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

IEC 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
IEC 61967-5:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
IEC 61000-4-6 : 4.0 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS
IEC 61000-4-6:2013 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
CISPR 25:2016 Vehicles, boats and internal combustion engines - Radio disturbance characteristics - Limits and methods of measurement for the protection of on-board receivers
IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
IEEE C63.2-2009 American National Standard for Electromagnetic Noise and Field Strength Instrumentation, 10 Hz to 40 GHz Specifications
IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
CISPR 16-1:1999+AMD1:2002 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus

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