IEC 62435-5:2017
Current
The latest, up-to-date edition.
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
01-20-2017
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Storage requirements
5 Long-term storage failure mechanisms
6 LTS concerns, method, verification and limitations
7 Deterioration mechanisms specific to bare die
and wafers
8 Specific handling concerns
Annex A (informative) - Audit checklist
Bibliography
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