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IEC 62525:2007

Current
Current

The latest, up-to-date edition.

Standard Test Interface Language (STIL) for Digital Test Vector Data
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

11-07-2007

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

DevelopmentNote
Also numbered as IEEE 1450. (11/2007) Stability Date: 2018. (12/2017)
DocumentType
Standard
Pages
143
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
BS IEC 62525:2007 Identical
NEN IEC 62525 : 2007 Identical

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