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IEC TS 62228:2007

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Integrated circuits - EMC evaluation of CAN transceivers
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

12-31-2021

Language(s)

English

Published date

02-16-2007

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Measurements and tests
  4.1 General
  4.2 RF and transient tests
  4.3 ESD
5 Test report
Annex A (informative) Test circuit boards
Annex B (informative) Documentation of test results
Bibliography

Specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of CAN transceivers concerning: - immunity against RF common mode disturbances on the signal lines - emissions caused by non-symmetrical signals regarding the time and frequency domain - immunity against transients (function and damage) - immunity against electrostatic discharges - ESD (damage)

DevelopmentNote
Stability Date: 2015. (10/2012)
DocumentType
Technical Specification
Pages
44
PublisherName
International Electrotechnical Committee
Status
Superseded

Standards Relationship
NEN NPR IEC/TS 62228 : 2007 Identical
DD IEC/TS 62228:2007 Identical

IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
ISO 7637-2:2011 Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
IEC 61000-4-2:2008 Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test

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