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IEC TS 62804-1:2015

IEC TS 62804-1:2015

Current

Current

The latest, up-to-date edition.

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1: Crystalline silicon

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

08-06-2015

Publisher

International Electrotechnical Committee

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Samples
4 Test procedures
5 Test report

IEC TS 62804-1:2015(E) defines procedures to test and evaluate the durability of crystalline silicon photovoltaic (PV) modules to the effects of short-term high-voltage stress including potential-induced degradation (PID). Two test methods are defined that do not inherently produce equivalent results. They are given as screening tests; neither test includes all the factors existing in the natural environment that can affect the PID rate. The methods describe how to achieve a constant stress level. The testing in this Technical Specification is designed for crystalline silicon PV modules with one or two glass surfaces, silicon cells having passivating dielectric layers, for degradation mechanisms involving mobile ions influencing the electric field over the silicon semiconductor, or electronically interacting with the silicon semiconductor itself.

DevelopmentNote
Stability date: 2019. (08/2015)
DocumentType
Technical Specification
Pages
15
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
DIN IEC/TS 62804-1 : 2017 Identical
VDE V 0126-37-1 : 2017 Identical
PD IEC/TS 62804-1:2015 Identical

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
IEC 61215:2005 Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval
IEC 61730-2:2016 Photovoltaic (PV) module safety qualification - Part 2: Requirements for testing
IEC 60410:1973 Sampling plans and procedures for inspection by attributes

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Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
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