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IEEE 1641.1-2013

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
Amended by

IEEE 1641.1: 2013/a:2018

Available format(s)

Hardcopy , PDF

Withdrawn date

03-21-2024

Language(s)

English

Published date

06-07-2013

Publisher

Institute of Electrical & Electronics Engineers

1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. Introduction to IEEE Std 1641
5. Describing signals using IEEE Std 1641
6. Signal models
7. Defining measurements with STD
8. Describing tests and test requirements
9. Basic signal components
10. Test signal framework
11. Digital signals
12. More about events and their interaction
13. Test Procedure Language
14. Signal Modeling Language
Annex A (informative) - Glossary
Annex B (informative) - Intrinsic measurement
Annex C (informative) - Generic measurement
Annex D (informative) - Role of Resource Adapter
        Information (RAI) in IEEE Std 1641
Annex E (informative) - Understanding IEEE 1641
        capabilities
Annex F (informative) - Implementation of IEEE 1641
        application techniques
Annex G (informative) - Bibliography

Presents application information and guidance for users who write, develop, implement, and support test requirements, signal definitions, and signal responses using IEEE Std 1641-2010, the signal and test definition (STD) standard.

Committee
SCC20 - Test and Diagnosis for Electronic Sys
DevelopmentNote
Supersedes IEEE DRAFT 1641.1. (10/2007)
DocumentType
Standard
ISBN
978-0-7381-8367-1
Pages
352
ProductNote
NEW CHILD A 2018 IS ADDED
PublisherName
Institute of Electrical & Electronics Engineers
Status
Withdrawn
Supersedes

DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
DEFSTAN 00-52/4(2014) : 2014 THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEEE 1671.3-2007 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML

IEEE 1641-2010 REDLINE IEEE Standard for Signal and Test Definition
IEEE 1671.6-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
IEEE/ASTM SI_10-2010 American National Standard for Metric Practice
IEEE 1671.2-2012 IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
IEEE 1671.1-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

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