Name: IEEE C62.37 : 1996
Brand: IEEE

IEEE C62.37 : 1996

Withdrawn

TEST SPECIFICATION FOR THYRISTOR DIODE SURGE PROTECTIVE DEVICES

Withdrawn date

10-17-2023

Published date

01-01-1996

Publisher

Institute of Electrical & Electronics Engineers

1 Overview
   1.1 Scope
   1.2 Tests
   1.3 Applicability and device function
2 Definitions of rated and other parameters
   2.1 Rated parameter values
   2.2 Definitions
   2.3 Additional definitions
   2.4 Temperature dependence of parameter
   2.5 Gated thyristor surge protective device (SPD)
3 Service condition
   3.1 Normal service conditions
   3.2 Unusual service conditions
4 Standard design test procedure
   4.1 Standard design test criteria
   4.2 Statistical analysis
   4.3 Thyristor surge protective devices (SPD)
        test conditions
   4.4 Rating test procedures
   4.5 Characteristic test procedures
5 Failure modes
   5.1 Degradation failure modes
   5.2 Catastrophic failure mode
   5.3 "Fail-safe" operation
Annex A (informative) - Thyristor terms
Annex B (informative) - Bibliography

Applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed to limit voltage surges on communication circuits and power circuits operating from a direct current (dc) to 420 Hz. Included in this standard are definitions, service conditions and a series of test criteria for the determining of characteristics of a thyristor SPD. If the characteristics differ with the direction of conduction then each polarity will be specified separately.

Committee	IEEE
DocumentType	Standard
PublisherName	Institute of Electrical & Electronics Engineers
Status	Withdrawn

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