IEEE DRAFT 1122 : AUG 96

1 Scope
2 References
3 General definitions
3.1 Digital recorder for measurements in high-voltage
         impulse tests (impulse digitizer)
3.2 Output of an impulse digitizer
3.3 Offset
3.4 Scale factor
3.5 Quantization characteristic
3.6 Static integral non-linearity (Is)
3.7 Rated resolution (r)
3.8 Full-scale value (Dfs)
3.9 Code k
3.10 Code bin width of code k (Wk)
3.11 Average code bin width (Wo)
3.12 Differential non-linearity (DNL)
3.13 Sampling Rate
3.14 Integral non-linearity of the time-base
3.15 Sampling interval variation
3.16 Record length
3.17 Quantization error
3.18 Warm-up time
3.19 Raw data
3.20 Least-processed data
3.21 Notation
3.22 Actual resolution (Ra)
3.23 Oversampling
3.24 Operating range:
4 Conditions of use
4.1 Range of operating conditions
4.2 Reference conditions
5 Analysis of the impulse waveform
5.1 General
5.2 Equivalent oscillogram method
5.3 Procedures for reading digital records
6 Accuracy requirements for impulse measurements
6.1 Limits on overall uncertainty
6.2 Limits on individual uncertainties
6.3 Input impedance
7 Acceptance tests
7.1 Differential non-linearity (impulse conditions)
7.2 Internal noise level
7.3 Rise time
7.4 Interference test
7.5 Ripple
7.6 Integral non-linearity
8 Performance tests
8.1 Pulse calibration
8.2 Alternative method
9 Performance checks
9.1 General
9.2 Pulse calibration
9.3 Alternative check
10 Record of performance
Annex A Bibliography