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IEEE DRAFT 1554 : D15D 2005

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

PRACTICE FOR INERTIAL SENSOR TEST EQUIPMENT, INSTRUMENTATION, DATA ACQUISITION, AND ANALYSIS
Superseded date

11-28-2005

Published date

01-12-2013

1 Overview
   1.1 Scope
   1.2 Purpose
2 References
   2.1 IEEE standards
   2.2 ISO standards
   2.3 Nuclear radiation test standards
3 Test planning
   3.1 Classification of tests
   3.2 Calibrated parameter characteristics
   3.3 Test plan outline
   3.4 Test station log book
4 General equipment
   4.1 Calibration of equipment
   4.2 Test station power supplies and grounds
   4.3 Time and frequency standard
   4.4 Precision voltage reference
   4.5 Voltmeters
   4.6 Ammeters and wattmeters
   4.7 Resistance references
   4.8 Magnetic field shielding
   4.9 Magnetic field generation and measurement
   4.10 Frequency synthesizers
   4.11 Oscilloscopes
   4.12 Spectrum analyzer
   4.13 Signal analyzer
   4.14 Voltage- or current-to-frequency converters
   4.15 Frequency counters
   4.16 Temperature controllers
   4.17 Temperature monitoring equipment
   4.18 Bubble levels and tilt meters
   4.19 Autocollimator
   4.20 Displacement measurement systems
   4.21 Other general commercial equipment
   4.22 Specially-built equipment
5 Sensor-specific equipment
6 Mounting fixture
   6.1 Fixture mechanical design
   6.2 Thermal control of fixture
   6.3 Vibration fixture
   6.4 Centrifuge fixture
   6.5 Radiation test fixture
7 Test piers
   7.1 Location of test piers
   7.2 Vibration environment of test pier
   7.3 Tilt and azimuth motion of test pier
   7.4 Active control of test pad
8 Accelerometer dividing heads (or turntables)
   8.1 Use of accelerometer dividing heads
   8.2 Placement of dividing head
   8.3 Thermal control on dividing head
   8.4 Alignment of dividing head and mounting fixture
   8.5 Wiring to dividing head
   8.6 Rotation of dividing head
   8.7 Readout of dividing head angles
9 Rate tables
   9.1 Use of rate tables
   9.2 Single-axis rate table
   9.3 Two-axis rate table
   9.4 Three-axis rate tables for inertial sensor assembly
         testing
10 Vibration and shock equipment
   10.1 Use of vibration and shock machines
   10.2 Vibrators
   10.3 Drop shock and hammer shock machines
   10.4 Air guns
   10.5 Shock and vibration monitors
11 Centrifuge
   11.1 Use of centrifuges
   11.2 Lesser accuracy and high speed centrifuges
   11.3 Precision centrifuge
   11.4 Double turntable centrifuge
   11.5 Centrifuge instrumentation
   11.6 Other rotating inertial sensor test equipment
12 Environmental chambers
   12.1 Thermal control on a test table, vibrator, or centrifuge
   12.2 Refrigerated and heated chambers
   12.3 Barometric chambers
   12.4 Equipment for electromagnetic susceptibility and emissions
         testing
   12.5 Acoustic absorption and generation
   12.6 Other environmental chambers
13 Nuclear radiation effects testing
   13.1 Use of nuclear radiation testing
   13.2 Basis of radiation testing requirements (radiation effects)
   13.3 Total ionizing dose effects testing
   13.4 Ionizing dose rate effects testing
   13.5 Displacement damage effects testing (neutron and protons)
   13.6 Single event effects testing (SEE)
   13.7 Thermo-mechanical effects testing (TME)
14 Counter and frequency readouts
   14.1 Counters and continuous counters
   14.2 Period readouts
   14.3 Frequency readouts
   14.4 Phase-locked loops
   14.5 Other ways of reading out frequency
15 Analog-to-digital conversion readouts
   15.1 Commercial voltmeters
   15.2 A/D converters
   15.3 Voltage- and current-to-frequency converters
16 Temperature monitoring
   16.1 General comments
   16.2 Calibration of temperature readout
   16.3 Types of temperature monitors
17 Other monitoring and commanding
   17.1 Analog input signals and signal conditioning
   17.2 Analog output signals
   17.3 Asynchronous interfaces
   17.4 Digital input and output signals
   17.5 Microprocessor interfaces
   17.6 IEEE-488 bus
   17.7 Other interface buses
   17.8 Radio telemetry interfaces
18 Computer data acquisition, control, filtering, and storage
   18.1 Real time operation
   18.2 Initialization and running of test
   18.3 Interfaces to computer backplane
   18.4 Experiment control and automatic test equipment
   18.5 Acquired signals
   18.6 Event recording
   18.7 Real time digital filtering
   18.8 Data storage
   18.9 Data transmission
19 Data analysis
   19.1 Data file format
   19.2 Plots versus time
   19.3 Plots of one channel versus another
   19.4 Polynomial and other linear least-squares-fit residual
         plots
   19.5 Power spectral density (PSD)
   19.6 Allan variance
   19.7 Noise processes
   19.8 Time series to verify PSD and Allan variance software
   19.9 Allan variance autofit procedure
   19.10 Regression analysis and cross power spectral density
   19.11 Parameter estimation
   19.12 Analysis of gyroscope and accelerometer drift data
   19.13 Analysis of data with varying test conditions
   19.14 Database of test results
20 Geophysics instrumentation
   20.1 Gravimeters
   20.2 Tilt and azimuth motion
   20.3 Seismometers
   20.4 Gyrocompass
   20.5 Surveying and GPS positioning
   20.6 Star sightings
21 Calibration of test equipment and instrumentation
   21.1 Site coordinates, gravity, and components of earth
         rotation rate
   21.2 Time and frequency references
   21.3 Calibration of electrical equipment
   21.4 Calibration of temperature measuring instrumentation
   21.5 Calibration of other equipment
Annex A (informative) Bibliography
      A.1 General Bibliography
      A.2 Nuclear radiation testing bibliography

Describes practices for gyroscope and accelerometer testing are discussed, ranging from the equipment and instrumentation employed to the way that tests are carried out and data are acquired and analyzed.

DocumentType
Draft
PublisherName
Institute of Electrical & Electronics Engineers
Status
Superseded

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES

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