JEDEC/IPC CURRENT TIN WHISKERS THEORY AND MITIGATION PRACTICES GUIDELINE

Available format(s)

Hardcopy

Language(s)

English

Published date

03-01-2006

Publisher

Institute of Printed Circuits

Provides insight into the theory behind tin whisker formation as it is known today and, based on this knowledge, potential mitigation practices that may delay the onset of, or prevent tin whisker formation.

DevelopmentNote	Included in IPC C 103, IPC C 105 & IPC C 1000. (07/2008)
DocumentType	Standard
Pages	16
PublisherName	Institute of Printed Circuits
Status	Current

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