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ISO 14571:2020

Current
Current

The latest, up-to-date edition.

Metallic coatings on non-metallic basis materials — Measurement of coating thickness — Micro-resistivity method
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, French

Published date

11-04-2020

This document specifies a method for non-destructive measurements of the thickness of conductive coatings on non-conductive base materials. This method is based on the principle of the sheet resistivity measurement and is applicable to any conductive coatings and layers of metal and semiconductor materials. In general, the probe has to be adjusted to the conductivity and the thickness of the respective application. However, this document focuses on metallic coatings on non-conductive base materials (e.g. copper on plastic substrates, printed circuit boards).

This method is also applicable to thickness measurements of conductive coatings on conductive base materials, if the resistivity of the coating and the base material is significantly different. However, this case is not considered in this document.

Committee
ISO/TC 107
DocumentType
Standard
Pages
9
PublisherName
International Organization for Standardization
Status
Current

Standards Relationship
NF EN ISO 14571:2022 Identical
ÖNORM EN ISO 14571:2023 02 15 Identical
SN EN ISO 14571:2022 Identical
UNI EN ISO 14571:2023 Identical
PN-EN ISO 14571:2023-05 Identical
BS EN ISO 14571:2022 Identical

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