ISO 21222:2020
Current
The latest, up-to-date edition.
Surface chemical analysis Scanning probe microscopy Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
01-29-2020
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.