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JIS C 5402-1-1:2005

JIS C 5402-1-1:2005

Current

Current

The latest, up-to-date edition.

Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination

Available format(s)

Hardcopy , PDF

Language(s)

Japanese, English

Published date

03-20-2005

Publisher

Japanese Standards Association

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This section of JIS C 5402-1 is to define a standard test method for the visual examination of electromechanical components.

DocumentType
Test Method
Pages
0
PublisherName
Japanese Standards Association
Status
Current

Standards Relationship
IEC 60512-1-1:2002 Identical

Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]

JIS C 5402-5-1:2005 Connectors for electronic equipment - Tests and measurements Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise
JIS C 5402-11-3:2005 Connectors for electronic equipment - Tests and measurements Part 11-3: Climatic tests - Test 11c: Damp heat, steady state
JIS C 5402-6-2:2005 Connectors for electronic equipment -- Tests and measurements Part 6-2: Dynamic stress tests - Test 6b: Bump
JIS C 5402-11-6:2005 Connectors for electronic equipment - Tests and measurements Part 11-6: Climatic tests - Test 11f: Corrosion, salt mist
JIS C 5402-11-4:2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-4: Climatic tests -- Test 11d: Rapid change of temperature Part 11-4: Climatic tests - Test 11d: Rapid change of temperature
JIS C 5402-11-7:2006 Connectors for electronic equipment -- Tests and measurements -- Part 11-7: Climatic tests -- Test 11g: Flowing mixed gas corrosion test
JIS C 5402-11-10:2005 Connectors for electronic equipment - Tests and measurements Part 11-10: Climatic tests - Test 11j: Cold
JIS C 5402-10-4:2006 Connectors For Electronic Equipment - Tests And Measurements - Part 10-4: Impact Tests (free Components), Static Load Tests (fixed Components), Endurance Tests And Overload Tests - Test 10d: Electrical Overload (connectors)
JIS C 5402-6-1:2005 Connectors for electronic equipment - Tests and measurements Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state
JIS C 5402-11-11:2005 Connectors for electronic equipment - Tests and measurements Part 11-11: Climatic tests - Test 11k: Low air pressure
JIS C 5402-11-5:2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-5: Climatic tests -- Test 11e: Mould growth Part 11-5: Climatic tests - Test 11e: Mould growth
JIS C 5402-6-3:2005 Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock Part 6-3: Dynamic stress tests - Test 6c: Shock
JIS C 5402-11-12:2005 Connectors for electronic equipment - Tests and measurements Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic
JIS C 5402-11-13:2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-13: Climatic tests -- Test 11n: Gas tightness, solderless wrapped connections<br>
JIS C 5402-11-14:2006 Connectors for electronic equipment - Tests and measurements Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test
JIS C 5402-6-4:2005 Connectors for electronic equipment -- Tests and measurements -- Part 6-4: Dynamic stress tests -- Test 6d: Vibration (sinusoidal)
JIS C 5402-11-9:2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-9: Climatic tests -- Test 11i: Dry heat Part 11-9: Climatic tests - Test 11i: Dry heat

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Hardcopy - Japanese
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