Customer Support: +1 416-401-8730

Login to i2i Subscription Intertek.com
  • There are no items in your cart
Please enter a keyword to search
Advanced search

JIS C 60068-2-17:2001

Current
Current

The latest, up-to-date edition.

Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing Part 2: Tests - Test Q: Sealing
Available format(s)

Hardcopy , PDF

Language(s)

Japanese, English

Published date

11-30-2001

Publisher

Japanese Standards Association

1 - 
2 - 
3 - 
4 - 
5 - 
6 - 
7 - 
8 - 
9 - 
10 - 
11 - 
12 - 
13 - 
14 - 
15 - 
16 - 
17 - 
18 - 
19 - 
20 - 
21 - 
22 - 
23 - 
24 - 
25 - 
26 - 
27 - 
28 - 
29 - 
30 - 
31 - 
32 - 
33 - 
34 - 
35 - 
36 - 
37 - 
38 - 
39 - 
40 - 
41 - 
42 - 
43 - 
44 - 
45 - 
46 - 
47 - 
48 - 
49 - 
50 - 
51 - 

DocumentType
Standard
Pages
0
PublisherName
Japanese Standards Association
Status
Current
Supersedes

Standards Relationship
IEC 60068-2-17:1994 Identical

Reaffirmed 2017

JIS C 60068-1:1993 Environmental testing Part 1: General and guidance
JIS C 5101-1:2023 Fixed capacitors for use in electronic equipment -- Part 1: Generic specification

JIS C 2570:1998 Directly heated negative temperature coefficient thermistors
JIS C 5101-14:1998 Fixed capacitors for use in electronic equipment. Part 14: Sectional specification: Fixed capacitors for electromagnetic interference suppression and connection to the supply mains
JIS C 5260-1:1999 Potentiometers for use in electronic equipment Part 1: Generic specification
JIS C 6703:2002 Generic specification of crystal filters
JIS C 6703:2008 Crystal filters
JIS C 6114-1:2006 General Rules Of Optical Modulator Modules
JIS C 5402:1992 Method for test of connectors for use in electronic equipment
JIS C 6115-1:2006 General Rules Of Pin-fet Modules
JIS C 60068-1:1993 Environmental testing Part 1: General and guidance
JIS C 5944:2005 General Rules Of Laser Diode Modules For Fiber Optic Transmission
JIS C 6462:1996 Test methods of variable capacitors for use in electronic equipment
JIS C 6701:2007 Generic specification of quartz crystal units
JIS C 6710:2007 Generic specification of crystal controlled oscillators
JIS C 5202:1990 Test methods of fixed resistors for electronic equipment
JIS C 5946:2005 General rules of laser diode modules for optical fiber amplifier
JIS C 5260-5:2000 Potentiometers For Use In Electronic Equipment - Part 5: Sectional Specification: Single-turn Rotary Low-power Wirewound Potentiometers
JIS C 5260-2:2000 Potentiometers For Use In Electronic Equipment - Part 2 - Sectional Specification: Lead-screw Actuated And Rotary Preset Potentiometers
JIS C 5260-4:2000 Potentiometers For Use In Electronic Equipment - Part 4: Sectional Specification: Single-turn Rotary Power Potentiometers
JIS C 2570-1:2006 Directly Heated Negative Temperature Coefficient Thermistors - Part 1: Generic Specification
JIS C 5260-3:2000 Potentiometers For Use In Electronic Equipment - Part 3 - Sectional Specification: Rotary Precision Potentiometers
JIS C 5101-4:1998 Fixed capacitors for use in electronic equipment. Part 4: Sectional specification: Aluminium electrolytic capacitors with solid and non-solid electrolyte
JIS C 5948:2007 Laser Modules Used For Telecommunication - Reliability Assessment

View more information
US$220.61
Excluding Tax where applicable
USD
CAD
CHF
CNY
DKK
EUR
GBP
HKD
IDR
INR
JPY
KRW
MXN
NOK
NZD
SEK
SGD
USD
ZAR
Hardcopy - Japanese
Hardcopy - English
PDF - English
01
02
03
04
05
06
07
08
09
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

or

Get in touch with us