RF Transistor, NPN, Silicon, Low Power, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Types 2N2857, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

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Published date

11-03-2016

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US Military Specs/Standards/Handbooks

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2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES

Specifies the performance requirements for NPN, silicon, low power, ultra-high frequency transistors.

This specification covers the performance requirements for NPN, silicon, low power, ultra-high frequency transistors. Four levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each device type. Two levels of product assurance (JANHC and JANKC) are provided for unencapsulated devices as specified in MIL-PRF-19500. RHA level designators “M”, “D”, “P“, “L”, “R”, “F”, “G”, and “H” are appended to the device prefix to identify devices, which have passed RHA requirements.

DevelopmentNote	Supersedes MIL S 19500/343 (C). (02/2000)
DocumentType	Standard
Pages	52
PublisherName	US Military Specs/Standards/Handbooks
Status	Current
Supersedes	MIL S 19500/343 : C

MIL-PRF-19500 Revision P:2010	SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-STD-750 Revision F:2011	TEST METHODS FOR SEMICONDUCTOR DEVICES

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MIL-PRF-19500-343 Revision M:2016

RF Transistor, NPN, Silicon, Low Power, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Types 2N2857, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

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