Transistor, PNP, Silicon, Low-Power, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N2944A, 2N2945A, 2N2946A, Quality Levels: JAN, JANTX, JANTXV, JANS, JANHC,and JANKC

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04-14-2017

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US Military Specs/Standards/Handbooks

1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES

Specifies the performance requirements for low-power, PNP, silicon 2N2944A, 2N2945A, 2N2946A transistors for use in high-speed, switching and general purpose amplifier applications.

This specification covers the performance requirements for low-power, PNP, silicon transistors for use in high-speed, switching and general purpose amplifier applications. A \'M\' and UB \'M\' suffix will indicate a matched pair. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance (RHA) to eight radiation levels is provided for quality levels JANTX, JANS, JANHC, and JANKC. RHA level designators \"M\", \"D\", \"P\", \"L\", \"R\", \"F\", \"G\", and \"H\" are appended to the device prefix to identify devices, which have passed RHA requirements.

DevelopmentNote	Supersedes MIL S 19500/382 (B) (02/2000)
DocumentType	Standard
Pages	64
PublisherName	US Military Specs/Standards/Handbooks
Status	Current
Supersedes	MIL S 19500/382 : B

MIL-PRF-19500 Revision P:2010	SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-STD-750 Revision F:2011	TEST METHODS FOR SEMICONDUCTOR DEVICES

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MIL-PRF-19500-382 Revision L:2017

Transistor, PNP, Silicon, Low-Power, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N2944A, 2N2945A, 2N2946A, Quality Levels: JAN, JANTX, JANTXV, JANS, JANHC,and JANKC

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