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MIL-PRF-19500-441 Revision L:2015

Current
Current

The latest, up-to-date edition.

Transistor, PNP, Silicon, Power, Encapsulated (Through Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N3740 and 2N3741 Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
Available format(s)

PDF

Published date

06-19-2015

1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES

Specifies the performance requirements for power PNP silicon 2N3740 and 2N3741 transistors.

This specification covers the performance requirements for power PNP silicon 2N3740 and 2N3741 transistors. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type and two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device type as specified in MIL-PRF-19500. Provisions for radiation hardness assurance (RHA) to eight radiation levels is provided for quality levels JANTXV, JANS, JANHC, and JANKC. RHA level designators “M”, “D”, “P”, “L”, “R”, “F”, “G”, and “H” are appended to the device prefix to identify devices, which have passed RHA requirements.

DevelopmentNote
Supersedes MIL PRF 19500/441 (D). (02/2000)
DocumentType
Standard
Pages
58
PublisherName
US Military Specs/Standards/Handbooks
Status
Current
Supersedes

MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES

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